Author: jpshield

Low kV, STEM FE-SEM Workshop

Low kV, STEM and Analytical FE-SEM Monday and Tuesday, April 23-24, 2018 8am to 5pm each day Barrow Hall, Room 154 Instructor: Eric Formo After the workshop, UGA participants are considered trained on the Teneo  Deadline: April 13th, 2018 Lunch provided each day...

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New Leica DVM6 light microscope

The Leica DVM is a light imaging scope with digital camera, z-stacking capabilities and analysis software.  Sign up to be trained on the software and operation through iLab...

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