Author: jpshield

Low kV Imaging and Analysis Short Course

Monday and Tuesday, Nov. 6-7, 2017 GEM will provide training on low kV analysis and imaging with SEM and STEM, Elemental analysis at accelerating energies below 30kV, post-image processing and material sample preparation. Two full days of training and hands-on experience with the FEI Teneo.  For UGA staff, students and faculty, this counts as training on the instrument
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