FEI Teneo

FEI Teneo Instrument

The FEI Teneo (FEI Co., Hillsboro, OR), a Field Emission Scanning Electron Microscope is the center’s analytical SEM. The Teneo has several different detectors including back-scatter and three in-lens detectors, and can be run at less than 5kV with beam deceleration for uncoated samples. It also has scanning transmission (STEM) capabilities for studying specimen-induced contrast. The Teneo is equipped with a large detector Oxford EDS system for elemental analysis and rapid mapping.