Low kV Imaging and Analysis Short Course

NEWS

Low kV Imaging and Analysis Short Course

Monday and Tuesday, Nov. 6-7, 2017

GEM will provide training on low kV analysis and imaging with SEM and STEM, Elemental analysis at accelerating energies below 30kV, post-image processing and material sample preparation.

Two full days of training and hands-on experience with the FEI Teneo.  For UGA staff, students and faculty, this counts as training on the instrument

Cost: $500

Where: GEM room 154 and 155 Barrow Hall, UGA campus

To sign up – register via iLab under “Request Services”

For more information contact Eric Formo (eformo@uga.edu) or call 706-542-4080