Low kV Imaging and Analysis Short Course
Monday and Tuesday, Nov. 6-7, 2017
GEM will provide training on low kV analysis and imaging with SEM and STEM, Elemental analysis at accelerating energies below 30kV, post-image processing and material sample preparation.
Two full days of training and hands-on experience with the FEI Teneo. For UGA staff, students and faculty, this counts as training on the instrument
Where: GEM room 154 and 155 Barrow Hall, UGA campus
To sign up – register via iLab under “Request Services”
For more information contact Eric Formo (firstname.lastname@example.org) or call 706-542-4080