STEM – Hitachi SU9000EA
The acquisition of this instrument was supported by the U.S. National Science Foundation under award number 1919942 via the Major Research Instrumentation (MRI) program.
Formo, E. V.; Howe, J.Y.; Sunaoshi, T.; Muto, A.; Kilcrease, J.; Salguero, T. “Application of Low kV EELS to Problematic Samples” Microscopy and Microanalysis, 2019, 25 (S2), 466-467.
Formo, E. V.; Salguero, T.; Howe, J. Y.; Sunaoshi, T.; Muto, A. “Insights Into the Structure of the Ligand Capping Layer of Inorganic Nanostructures via Multi kV Electron Microscopy Analysis” Microscopy and Microanalysis, 2018, 24 (S1), 676-677.
Sunaoshi, T.; Okada, S.; Kaji, K.; Voelkl, E.; Ramachandran, R.; Salguero, T. “Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons” Microscopy and Microanalysis, 2017, 22 (S1), 1830-1831.
